FIB / TEM Ga Focused Ion Beam Instrument and Transmission Electron Microscope

The two instruments shall warrant a smooth workflow for TEM sample preparation by FIB and state-of-the-art sample characterization by analytical, high-resolution TEM/STEM, particularly, but not exclusively. A broad spectrum of materials science samples shall be addressed, including highly fragile and beam-sensitive samples such as, e.g., Li-based thin-film battery materials, carbon-based …

CPV: 38000000 Laboratory, optical and precision equipments (excl. glasses), 38511000 Electron microscopes
Deadline:
Aug. 10, 2025, 11:59 p.m.
Deadline type:
Submitting a bid
Place of execution:
FIB / TEM Ga Focused Ion Beam Instrument and Transmission Electron Microscope
Awarding body:
Empa zentraler Einkauf
Award number:

1. Buyer

1.1 Buyer

Official name : Empa zentraler Einkauf
Legal type of the buyer : Body governed by public law
Activity of the contracting authority : Education

2. Procedure

2.1 Procedure

Title : FIB / TEM Ga Focused Ion Beam Instrument and Transmission Electron Microscope
Description : The two instruments shall warrant a smooth workflow for TEM sample preparation by FIB and state-of-the-art sample characterization by analytical, high-resolution TEM/STEM, particularly, but not exclusively. A broad spectrum of materials science samples shall be addressed, including highly fragile and beam-sensitive samples such as, e.g., Li-based thin-film battery materials, carbon-based nanomaterials or zeolites for catalytic applications. Energy dispersive X-ray (EDX) analytics is required on both instruments, special acquisition modes in STEM are desirable, namely 4D-STEM in combination with the TEM camera, and a segmented detector for differential phase contrast STEM. Besides TEM sample preparation, the FIB instrument shall be employed for 3D imaging by consecutively ion-beam milling and imaging. To warrant smooth and efficient operation of these multi-user instruments, an important aspect lies on automatic or semi-automatic routines, particularly concerning materials processing by FIB.
Procedure identifier : a58903b5-3ccb-49ec-b2a8-60a78eba9df2
Type of procedure : Open
The procedure is accelerated : no
Justification for the accelerated procedure :
Main features of the procedure :

2.1.1 Purpose

Main nature of the contract : Supplies
Main classification ( cpv ): 38511000 Electron microscopes

2.1.4 General information

Legal basis :
Directive 2014/24/EU

2.1.6 Grounds for exclusion

Sources of grounds for exclusion : Notice
Analogous situation like bankruptcy, insolvency or arrangement with creditors under national law : Further details in the official publication on simap.ch

5. Lot

5.1 Lot technical ID : LOT-0000

Title : FIB / TEM Ga Focused Ion Beam Instrument and Transmission Electron Microscope
Description : The two instruments shall warrant a smooth workflow for TEM sample preparation by FIB and state-of-the-art sample characterization by analytical, high-resolution TEM/STEM, particularly, but not exclusively. A broad spectrum of materials science samples shall be addressed, including highly fragile and beam-sensitive samples such as, e.g., Li-based thin-film battery materials, carbon-based nanomaterials or zeolites for catalytic applications. Energy dispersive X-ray (EDX) analytics is required on both instruments, special acquisition modes in STEM are desirable, namely 4D-STEM in combination with the TEM camera, and a segmented detector for differential phase contrast STEM. Besides TEM sample preparation, the FIB instrument shall be employed for 3D imaging by consecutively ion-beam milling and imaging. To warrant smooth and efficient operation of these multi-user instruments, an important aspect lies on automatic or semi-automatic routines, particularly concerning materials processing by FIB.

5.1.1 Purpose

Main nature of the contract : Supplies
Main classification ( cpv ): 38511000 Electron microscopes
Additional classification ( cpv ): 38000000 Laboratory, optical and precision equipments (excl. glasses)

5.1.2 Place of performance

Town : Dübendorf
Postcode : 8600
Country subdivision (NUTS) : Zürich ( CH040 )
Country : Switzerland
Additional information :

5.1.3 Estimated duration

Other duration : Unknown

5.1.4 Renewal

Maximum renewals : 0

5.1.6 General information

Reserved participation : Participation is not reserved.
The names and professional qualifications of the staff assigned to perform the contract must be given : Not yet known
Procurement Project not financed with EU Funds.
The procurement is covered by the Government Procurement Agreement (GPA) : yes

5.1.10 Award criteria

Criterion :
Type : Quality
Name :
Description : Award criteria
Description of the method to be used if weighting cannot be expressed by criteria : The award criteria are defined in the documentation.
Justification for not indicating the weighting of the award criteria :

5.1.11 Procurement documents

Access to certain procurement documents is restricted
Ad hoc communication channel :
Name : Simap.ch

5.1.12 Terms of procurement

Terms of submission :
Electronic submission : Allowed
Languages in which tenders or requests to participate may be submitted : English, German
Electronic catalogue : Not allowed
Variants : Not allowed
Tenderers may submit more than one tender : Not allowed
Deadline for receipt of tenders : 10/08/2025 23:59 +02:00
Deadline until which the tender must remain valid : 180 Day
Terms of contract :
The execution of the contract must be performed within the framework of sheltered employment programmes : Not yet known
Conditions relating to the performance of the contract : Further details in the official publication on simap.ch
Electronic invoicing : Required
Electronic ordering will be used : no
Electronic payment will be used : yes
Financial arrangement : Further details in the official publication on simap.ch

5.1.15 Techniques

Framework agreement :
No framework agreement
Information about the dynamic purchasing system :
No dynamic purchase system

5.1.16 Further information, mediation and review

Review organisation : Tribunal administrativ federal -
Information about review deadlines : Instructions on legal remedies In accordance with Article 56 paragraph 1 of the Public Procurement Act (PPA), a written appeal against this decision can be lodged with the Federal Administrative Court, P.O. Box, 9023 St. Gallen, Switzerland, within 20 days of notification. Any appeal is to be submitted in duplicate and must include what is being sought, the grounds for appeal, evidence and the signature of the person lodging the appeal or his or her representative. A copy of this decision and available evidence must be included. The provisions of the Administrative Procedure Act (APA) on legal holidays do not apply in accordance with Article 56 paragraph 2 of the PPA.
Organisation providing additional information about the procurement procedure : Empa zentraler Einkauf -

8. Organisations

8.1 ORG-0001

Official name : Empa zentraler Einkauf
Registration number : c3a1f91f-fb22-4c7e-ab7d-ecba1fd8a7f4
Postal address : Überlandstrasse 129
Town : Dübendorf
Postcode : 8600
Country subdivision (NUTS) : Zürich ( CH040 )
Country : Switzerland
Telephone : +41587656167
Roles of this organisation :
Buyer
Organisation providing additional information about the procurement procedure

8.1 ORG-0002

Official name : Tribunal administrativ federal
Registration number : BVGER
Postal address : Postfach
Town : St. Gallen
Postcode : 9023
Country subdivision (NUTS) : St. Gallen ( CH055 )
Country : Switzerland
Telephone : +41584652626
Internet address : https://www.bvger.ch
Roles of this organisation :
Review organisation

8.1 ORG-0003

Official name : Simap.ch
Registration number : CH001
Postal address : Holzikofenweg 36
Town : Bern
Postcode : 3003
Country subdivision (NUTS) : Bern / Berne ( CH021 )
Country : Switzerland
Telephone : +41584646388
Internet address : https://www.simap.ch
Roles of this organisation :
TED eSender
Notice information
Notice identifier/version : 4652968f-922c-450c-b7dc-c2193f75c6f8 - 01
Form type : Competition
Notice type : Contract or concession notice – standard regime
Notice dispatch date : 19/06/2025 02:26 +02:00
Languages in which this notice is officially available : English
Notice publication number : 00401149-2025
OJ S issue number : 117/2025
Publication date : 20/06/2025