Your search for Scanning electron microscopes
Number of alerts found: 20

FOURNITURE D’UN MICROSCOPE ELECTRONIQUE A BALAYAGE

Microscope électronique à balayage (MEB) compatible avec le domaine de la microélectronique et à installer dans un environnement de salle blanche ISO6 Microscope électronique à balayage (MEB) compatible avec le domaine de la microélectronique et à installer dans un environnement de salle blanche ISO6

CPV: 38511100 Scanning electron microscopes
Deadline:
June 27, 2025, 4 p.m.
Deadline type:
Submitting a bid
Place of execution:
FOURNITURE D’UN MICROSCOPE ELECTRONIQUE A BALAYAGE
Awarding body:
Commissariat à l'énergie atomique et aux énergies alternatives
Award number:
B25-01068
Publication:
April 30, 2025, 5:05 a.m.
Raith Electron-Beam Lithography Hardware and Software upgrade

This voluntary ex-ante transparency VEAT notice acknowledges that Trinity College Dublin intends to award a contract to EM Systems Support Ltd., Media House, London Road, Adlington, Cheshire, SK10 4NL, United Kingdom. The contract is for the refurbishment and upgrade of the Raith Laser Interferometer Stage (LIS) located in CRANN, Naughton …

CPV: 38511100 Scanning electron microscopes
Place of execution:
Raith Electron-Beam Lithography Hardware and Software upgrade
Awarding body:
Trinity College Dublin the University of Dublin_336
Award number:
TCD-25-C1978
Publication:
April 30, 2025, 4:45 a.m.
Avviso di indagine di mercato per verifica unicità fornitore ex art. 76 c. 2 lett. b) del D.Lgs. n. 36/2023 - fornitura di un microscopio elettronico a scansione SEM

Avviso di indagine di mercato per verifica unicità fornitore ex art. 76 c. 2 lett. b) del D.Lgs. n. 36/2023 - fornitura di un microscopio elettronico a scansione SEM Avviso di indagine di mercato per verifica unicità fornitore ex art. 76 c. 2 lett. b) del D.Lgs. n. 36/2023 - …

CPV: 38511100 Scanning electron microscopes
Place of execution:
Avviso di indagine di mercato per verifica unicità fornitore ex art. 76 c. 2 lett. b) del D.Lgs. n. 36/2023 - fornitura di un microscopio elettronico a scansione SEM
Awarding body:
UNIVERSITA' DEGLI STUDI DI MILANO - BICOCCA - Area Infrastrutture e Approvvigionamenti
Award number:
Publication:
April 30, 2025, 4:41 a.m.
3D LIT-OBIRCH system (IMWS-2.1) +Scanning Electron Microscope with ultrafast e-beam operation (IMWS-3.1 ) - PR876527-2690-P

3D LIT-OBIRCH system (IMWS-2.1) +Scanning Electron Microscope with ultrafast e-beam operation (IMWS-3.1 ) 3D LIT-OBIRCH system (IMWS-2.1) +Scanning Electron Microscope with ultrafast e-beam operation (IMWS-3.1 ) Das Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS erforscht das Anwendungsverhalten, die Zuverlässigkeit, Sicherheit und Lebensdauer innovativer Materialien in Komponenten und Systemen. Der …

CPV: 38511100 Scanning electron microscopes, 38512100 Ion microscopes
Place of execution:
3D LIT-OBIRCH system (IMWS-2.1) +Scanning Electron Microscope with ultrafast e-beam operation (IMWS-3.1 ) - PR876527-2690-P
Awarding body:
Fraunhofer-Gesellschaft - Einkauf B12
Award number:
PR876527-2690-P
Publication:
April 29, 2025, 5:59 a.m.
Precise ion beam based trenching tool (IMWS-03.2) + high performance Ga-FIB sample preparation (IMWS-08.1) + high performance analyical SEM inspection (IMWS-08.2) - PR924050-2690-P

Precise ion beam based trenching tool (IMWS-03.2) + high performance Ga-FIB sample preparation (IMWS-08.1) + high performance analyical SEM inspection (IMWS-08.2) Precise ion beam based trenching tool (IMWS-03.2) + high performance Ga-FIB sample preparation (IMWS-08.1) + high performance analyical SEM inspection (IMWS-08.2) Los 1: Precise ion beam based trenching tool …

CPV: 38511100 Scanning electron microscopes
Place of execution:
Precise ion beam based trenching tool (IMWS-03.2) + high performance Ga-FIB sample preparation (IMWS-08.1) + high performance analyical SEM inspection (IMWS-08.2) - PR924050-2690-P
Awarding body:
Fraunhofer-Gesellschaft - Einkauf B12
Award number:
PR924050-2690-P
Publication:
April 29, 2025, 4:26 a.m.
Suministro e instalación de un microscopio electrónico de barrido de emisión de campo con detector de rayos x, destinado al Instituto de Microelectrónica de Barcelona de la Agencia Estatal Consejo Superior de Investigaciones Científicas.

Según se indica en la memoria justificativa de las especificaciones técnicas, en la memoria justificativa de la necesidad de contratar, y en el pliego de prescripciones técnicas. Según se indica en la memoria justificativa de las especificaciones técnicas, en la memoria justificativa de la necesidad de contratar, y en el …

CPV: 38511100 Scanning electron microscopes
Place of execution:
Suministro e instalación de un microscopio electrónico de barrido de emisión de campo con detector de rayos x, destinado al Instituto de Microelectrónica de Barcelona de la Agencia Estatal Consejo Superior de Investigaciones Científicas.
Awarding body:
Presidencia de la Agencia Estatal Consejo Superior de Investigaciones Científicas, M.P.
Award number:
33126/25
Publication:
April 26, 2025, 2:13 a.m.
PROCEDURA APERTA SOPRA SOGLIA COMUNITARIA AI SENSI DELL’ART. 71 DEL D. LGS. N. 36/2023 PER L’AFFIDAMENTO DELLA FORNITURA, INSTALLAZIONE E MESSA IN FUNZIONE DI UN MICROSCOPIO A FASCIO IONICO FOCALIZZATO (FIB) COMBINATO CON UN MICROSCOPIO ELETTRONICO A SCANSIONE (SEM) PER LA PREPARAZIONE DI CAMPIONI PER MICROSCOPIA ELETTRONICA NELL’AMBITO DEL PNRR M4 C2 INVESTIMENTO 3.1 PROGETTO iENTRANCE@ENL

MICROSCOPIO A FASCIO IONICO FOCALIZZATO (FIB) COMBINATO CON UN MICROSCOPIO ELETTRONICO A SCANSIONE (SEM), di seguito indicato come MICROSCOPIO FIB-SEM, per effettuare le seguenti attività principali: - osservazione a risoluzione nanometrica di micro e nanostrutture mediante immagini di elettroni secondari, retrodiffusi e trasmessi; - realizzazione completa e anche assistita da …

CPV: 38511100 Scanning electron microscopes
Deadline:
May 26, 2025, noon
Deadline type:
Submitting a bid
Place of execution:
PROCEDURA APERTA SOPRA SOGLIA COMUNITARIA AI SENSI DELL’ART. 71 DEL D. LGS. N. 36/2023 PER L’AFFIDAMENTO DELLA FORNITURA, INSTALLAZIONE E MESSA IN FUNZIONE DI UN MICROSCOPIO A FASCIO IONICO FOCALIZZATO (FIB) COMBINATO CON UN MICROSCOPIO ELETTRONICO A SCANSIONE (SEM) PER LA PREPARAZIONE DI CAMPIONI PER MICROSCOPIA ELETTRONICA NELL’AMBITO DEL PNRR M4 C2 INVESTIMENTO 3.1 PROGETTO iENTRANCE@ENL
Awarding body:
Consiglio Nazionale delle Ricerche - Istituto per lo Studio dei Materiali Nanostrutturati Sede di Bologna
Award number:
DEFAULT_VALUE_CHANGE_ME
Publication:
April 25, 2025, 3:25 a.m.
UCDOPP5437 - UCD Wishes to Purchase a Micro Particle Imaging Velcoimetry Microscope

UCDOPP5437 - UCD Wishes to Purchase a Micro Particle Imaging Velcoimetry Microscope UCDOPP5437 - UCD Wishes to Purchase a Micro Particle Imaging Velcoimetry Microscope

CPV: 38513100 Inverted microscopes, 38511100 Scanning electron microscopes, 38513200 Metallurgical microscopes, 38511200 Transmission electron microscope, 38514100 Darkfield microscopes, 38515000 Fluorescent and polarising microscopes, 38514200 Scanning probe microscopes, 38515100 Polarising microscopes, 38516000 Monocular and/or binocular light compound microscopes, 38517000 Acoustic and projection microscopes, 38634000 Optical microscopes, 38519400 Automated microscope stages, 38512000 Ion and molecular microscopes, 38512100 Ion microscopes, 38511000 Electron microscopes, 38512200 Molecular microscopes
Place of execution:
UCDOPP5437 - UCD Wishes to Purchase a Micro Particle Imaging Velcoimetry Microscope
Awarding body:
University College Dublin ( UCD )
Award number:
0
Publication:
April 17, 2025, 7 a.m.
fornitura di n. 2 attrezzature scientifiche ad elevato contenuto tecnologico per l’allestimento del laboratorio L1 del progetto Dipartimenti di Eccellenza 2023-2027

procedura di gara aperta da aggiudicare con il criterio dell’offerta economicamente più vantaggiosa, ai sensi degli artt. 71 e 108, comma 1, del D. Lgs. n. 36/2023 e s.m.i., articolata in n. 2 lotti, per l’affidamento del contratto di appalto avente ad oggetto la Fornitura di n. 2 attrezzature scientifiche …

CPV: 38511100 Scanning electron microscopes, 38582000 X-ray inspection equipment
Deadline:
May 26, 2025, noon
Deadline type:
Submitting a bid
Place of execution:
fornitura di n. 2 attrezzature scientifiche ad elevato contenuto tecnologico per l’allestimento del laboratorio L1 del progetto Dipartimenti di Eccellenza 2023-2027
Awarding body:
Università degli studi di Napoli Federico II
Award number:
DEFAULT_VALUE_CHANGE_ME
Publication:
April 16, 2025, 5:49 a.m.
Acquisition, livraison, installation, mise en service et prestations associées d'équipements de congélation ultra-rapide par cryofixation haute pression et par plunge freezing pour la plateforme BIC de l'Université de Bordeaux

Le présent accord-cadre est constitué de 2 lots : Lot 1 : Achat, livraison, installation et mise en service d'un système de cryofixation haute pression, formation des personnels référents du Bordeaux Imaging Center à l'utilisation et à la maintenance de niveau I qui sera facilitée par la fourniture de manuels …

CPV: 38511100 Scanning electron microscopes
Deadline:
May 12, 2025, 5 p.m.
Deadline type:
Submitting a bid
Place of execution:
Acquisition, livraison, installation, mise en service et prestations associées d'équipements de congélation ultra-rapide par cryofixation haute pression et par plunge freezing pour la plateforme BIC de l'Université de Bordeaux
Awarding body:
Université de Bordeaux
Award number:
2025-019
Publication:
April 12, 2025, 5:20 a.m.